Request a measurement slot
The more precisely you describe the device under test, its development stage and your timeframe, the more concrete our reply will be. You will receive a prompt response on the most suitable measurement option.
Request a measurement slot
Briefly describe your device under test, its development stage and your timeframe. You will receive a prompt response on the most suitable measurement option.
Direct contact
Test centres
- Harbke – Fully anechoic chamber
Test environment up to 10 GHz - Meine – Shielded chamber
Complementary shielded test environment
